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TEST BURN-IN PGA
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Menge:
ISO1641BDR
Texas Instruments
BK1301-7R
Bel Power Solutions
SPMWH1228FD5WAUKS4
Samsung Semiconductor, Inc.
3QHTF22-79.388-PD
Mercury United Electronics, Inc.
LSQBA251818T102K
Taiyo Yuden